Information about the company

Working areas

Electrical, optical and mechanical analysis of microelectronics devices and circuits.

• Short presentation of electrical analysis equipment
• Short presentation of optical analysis equipment
• Short presentation of special laboratory equipment

Failure analysis with consideration of EMC problems, provisions for higher ESD protection of microelectronics circuits:

• Analysis and modelling of IC failure mechanism like Latch-Up, EMC problems and ESD casualty.

Measurement based characterization of semiconductor processes and devices:

• Characterization and documentation of electrical behaviour of integrated and discrete devices.
• AC-DC parameter extraction for bipolar and CMOS devices in case or on chip/wafer.
• Model transformation and adaptation with regard of different accuracy level or used simulator.
• High accuracy modeling of devices, pin-structures and macrocircuits based on table look-up models.

Measurement based modelling of devices and circuits - Macro modeling (SPICE language level, AHDL like M, MAST or high level language interfaces):

• Parasitic elements and phenomenon in bipolar and MOS structures
• Quasi-Saturation on bipolar and DMOS transistors
• Thermal effects in bipolar and MOS devices (self heating, thermal coupling and destroying)
• GaAS-FET Modellierung
• Measurement and modeling for simulation models of integrated devices.
• Depletion- and Highvoltage-MOS-Transistors
• 1/f-Rauschen
• RF-diodes
• Complex analog and digital devices of communication and power electronic
• Logical Gates and I/O stages (IBIS), Wandler (DA/AD)
• Transmission line modelling (high-speed data transfer, integrity test in PCB design, IC-wiring up to 200 MHz)

Simulation of and nonelectrical systems.

Software solutions adapted to your system, your simulator and your problem.E.g.:

• Measurement software for the automated execution of measurement programs for electronic devices

Technical consulting in certification and quality management of the considered and analyzed problem.